With the Helios 5 DualBeam, we analyze materials and surfaces at the highest level. The combination of a scanning electron microscope (SEM, German: REM) and a focused ion beam (FIB) enables targeted sample preparation, cross-sectioning, and the visualization of even the finest structural details, including particle and polymer structures.
The integration of a TOFWERK time-of-flight SIMS detector additionally provides chemical composition information based on emitted secondary ions. This results in a three-dimensional representation of both structure and chemistry down to the nanoscale—within a single measurement.
At ILM, this system provides you with a high-performance analytical platform that is unique in Germany, enabling 3D chemical imaging with nanometer-scale depth resolution. Thanks to correlative analysis, you can simultaneously visualize structural, chemical, and functional properties of your materials—from surface morphology and layer thickness to elemental composition. This allows even highly complex material and biological samples to be characterized with exceptional precision.
These insights provide a comprehensive understanding and support well-founded decision-making in materials development, quality control, and biomedical research.
Benefit from our expertise and receive tailored solutions for your specific challenges. All technical information can be found in our data sheet. Get in touch with us today – we look forward to your inquiry!


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