Exact measurement of highly scattering media by means of coherence effect

Coherent backward scattering is an effect based on interference, which leads to an increase in the power detected in the backward direction (relative to the direction of irradiation) of up to a factor of two. From the angle-dependent course of the intensity increase, the scattering and

absorption properties of the investigated samples can be concluded can be concluded by comparison with exact solutions of the radiation transport theory. The ILM has developed a measurement system that enables the determination of the spectrally resolved optical properties.

Highlights and fields of application


  • Determination of the scattering coefficient of strongly scattering media
  • Correct evaluation of measurement data using solutions of the radiative transfer equation taking into account interference effects
  • Suitable for liquids and solids
  • Position-independent measurement method

Fields of application:

  • Material analysis
  • Determination of ingredient concentrations
  • Analysis of microstructure
  • Process control in the pharmaceutical industry, e.g. monitoring the applied pressure during the production of tablets

[1] Hank, Philipp, Foschum, Florian, Geiger, Simeon and Alwin Kienle. "Efficient electrical field Monte Carlo simulation of coherent backscattering." Journal of Quantitative Spectroscopy and Radiative Transfer.

[2] Hank, Philipp, Liemert, André and Alwin Kienle. "Analytical solution of the radiative transfer theory for the coherent backscattering from two-dimensional semi-infinite media". Journal of the Optical Society of America A, Vol. 39, pp. 634-642.

[3] Krauter, Philipp, Zoller, Christian and Alwin Kienle. "Double Anisotropic Coherent Backscattering of Light". Optics Letters, Vol. 43, Issue 8, pp. 1702-1705.

[4] Häffner, Anika, Krauter, Philipp and Kienle, Alwin. "Density-dependent determination of scattering properties of pharmaceutical tablets using coherent backscattering spectroscopy". Optics Express, Vol 26, Issue 16, pp. 19964-19971.


Prof. Dr. Alwin Kienle

Prof. Dr. Alwin Kienle

Director Materials Optics & Imaging

Tel: +49 (0)731 / 1429 224

Ihr Kontakt zu uns

Wir sind jederzeit gerne für Sie da.

Ganz egal, ob Sie uns lieber online, telefonisch oder persönlich erreichen möchten – wir helfen Ihnen immer gerne weiter.

I have read the privacy policy and agree that the data I have provided may be collected and stored electronically. My data will only be used strictly for the purpose of processing and answering my request. By submitting the contact form, I agree to the processing of my data.

Privacy policy settings

Cookie settings
This website uses cookies that enable services offered by external providers, such as YouTube or Google Maps. The legal basis here is Art. 6 GDPR (1) a.

You can object to the anonymized recording of your user behavior by MATOMO here. For this purpose, we store a cookie on your computer in order to respect this decision on subsequent visits.

Please note that, depending on your settings, some functions may not be available.

You can find more information in our privacy policy

Matomo settings

Please note: When you object to tracking, a Matomo deactivation cookie is set that remembers your objection.