Exact measurement of highly scattering media by means of coherence effect

Coherent backward scattering is an effect based on interference, which leads to an increase in the power detected in the backward direction (relative to the direction of irradiation) of up to a factor of two. From the angle-dependent course of the intensity increase, the scattering and

absorption properties of the investigated samples can be concluded can be concluded by comparison with exact solutions of the radiation transport theory. The ILM has developed a measurement system that enables the determination of the spectrally resolved optical properties.

Highlights and fields of application

Highlights:

Determination of the scattering coefficient of strongly scattering media
Correct evaluation of measurement data using solutions of the radiative transfer equation taking into account interference effects
Suitable for liquids and solids
Position-independent measurement method

Fields of application:

Material analysis
Determination of ingredient concentrations
Analysis of microstructure
Process control in the pharmaceutical industry, e.g. monitoring the applied pressure during the production of tablets

[1] Hank, Philipp, Foschum, Florian, Geiger, Simeon and Alwin Kienle. "Efficient electrical field Monte Carlo simulation of coherent backscattering." Journal of Quantitative Spectroscopy and Radiative Transfer.

[2] Hank, Philipp, Liemert, André and Alwin Kienle. "Analytical solution of the radiative transfer theory for the coherent backscattering from two-dimensional semi-infinite media". Journal of the Optical Society of America A, Vol. 39, pp. 634-642.

[3] Krauter, Philipp, Zoller, Christian and Alwin Kienle. "Double Anisotropic Coherent Backscattering of Light". Optics Letters, Vol. 43, Issue 8, pp. 1702-1705.

[4] Häffner, Anika, Krauter, Philipp and Kienle, Alwin. "Density-dependent determination of scattering properties of pharmaceutical tablets using coherent backscattering spectroscopy". Optics Express, Vol 26, Issue 16, pp. 19964-19971.

Contactpersons

Prof. Dr. Alwin Kienle

Director Materials Optics & Imaging

Write an email Tel: +49 (0)731 / 1429 224

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